ParticleX TC Automatic Foreign Object Analysis SEM
We will fully automate the detection of foreign substances and impurities, size measurement, and elemental analysis.
For inquiries about this product, please visit our website below. https://www.kbk.co.jp/ja The Phenom ParticleX TC Automatic Contaminant Analysis SEM is a particle automatic analysis device that automatically detects, measures the size, and analyzes the elements of contaminants (contaminations) found in finished vehicles and parts in automotive manufacturing. While traditional weight analysis can determine the total weight of contaminants attached to components, it cannot identify their source. The Phenom ParticleX TC Automatic Contaminant Analysis SEM captures the source of each individual contaminant and impurity by obtaining size, shape, and composition data, thereby supporting the investigation of defects and improving product quality.
- Company：極東貿易
- Price：Other
